Would it be possible to collect better data by correlating SMART data across drive manufacturer? Sure it'd be a smaller sample size, but if all Western Digitals

Would it be possible to collect better data by correlating SMART data across drive manufacturer? Sure it'd be a smaller sample size, but if all Western Digitals start to indicate failure in the same way (that would be obscured by having other manufacturer specific data blended in), it might be worth the effort.