You are correct. I want to clarify that the failure process is electromigration, not electron migration. It is caused by electrons but it is ions in metal that

You are correct. I want to clarify that the failure process is electromigration, not electron migration. It is caused by electrons but it is ions in metal that migrate. Wikipedia has a good description: https://en.wikipedia.org/wiki/Electromigration https://en.wikipedia.org/wiki/Electromigration. I design integrated circuits and one of the constraints in selecting the width of wires is to make sure that the maximum current density is below the electromigration threshold.