From what I've gathered, heat absolutely does[1] affect[2] it[3]: Subsequently, in 1967, Black of Motorola experimentally derived a median time to failure (MTT

From what I've gathered, heat absolutely does[1] affect[2] it[3]: Subsequently, in 1967, Black of Motorola experimentally derived a median time to failure (MTTF, i.e., operational lifetime) model for EM in Al interconnects, showing that the time to failure due to EM is inversely proportional to both the current density and the absolute temperature of the interconnect. [1]: https://infinitalab.com/blog/ic-failure-analysis-defect-types/#Common_IC_Failure_Mechanisms https://infinitalab.com/blog/ic-failure-analysis-defect-type... [2]: https://resources.system-analysis.cadence.com/blog/msa2020-blacks-equation-for-mttf-due-to-electromigration https://resources.system-analysis.cadence.com/blog/msa2020-b... [3]: https://www.mdpi.com/2079-9292/14/15/3151#sec3-electronics-14-03151 https://www.mdpi.com/2079-9292/14/15/3151#sec3-electronics-1...