> I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary. To

> I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary. To be fair it’s great advice when you’re dealing with atoms. Mutable patterns of electrons, not so much (: