Here is an amazing discussion of that problem and a description of several metrics that answer your question: https://spectrum.ieee.org/amp/a-better-way-to-meas

Here is an amazing discussion of that problem and a description of several metrics that answer your question: https://spectrum.ieee.org/amp/a-better-way-to-measure-progress-in-semiconductors-2650280265 https://spectrum.ieee.org/amp/a-better-way-to-measure-progre...