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Yeah, this article could also be summarized as: electromigration exists, news at 11. It's literally always been a problem, it just might be exacerbated by incre
by Kirby64 2y ago
Yeah, this article could also be summarized as: electromigration exists, news at 11. It's literally always been a problem, it just might be exacerbated by increased thermal cycling and increased high temperature conditions of computationally intensive modern vehicles.
- MobiusHorizons 2y agoDoes it start to have an impact faster on smaller nodes? I know automotive chips have been migrating to newer nodes (like 28nm not cutting edge) in response to the chip shortage, and I’m curious if that might impact this aging effect. Edit: read the article, this seems to be what the article suggests as well
- Kirby64 2y agoYes, sort of. Electromigration is well known in the industry and there are extensive design rules around making sure you don't violate those rules and hit electromigration limits within the lifetime of the product. Most IC designers tend to design for the 100k hours at absolute worst case conditions. What is known as PVT: worst case process, voltage, and temperature corners. Assuming they do that, the likelihood that electromigration actually being the issue is not a concern. Designers can mess up, but generally they don't want to do this... especially in automotive. Auto manufacturers will ruin them if they determine there's a design flaw like this.