Where did you get the number of 4x from? It seems different than what I understand, but I don't have any sources handy. "Modern electronics are more fragile" i

Where did you get the number of 4x from? It seems different than what I understand, but I don't have any sources handy. "Modern electronics are more fragile" issue really is not overblown. One of my peers have tested different types of non volatile memory in LEO and the TLC NAND sample gets totally wiped by ionizing radiation within the first week. CPUs, while being mostly logic and less susceptible to low energy events, can still be easily destroyed especially if radiation causes latchup. MMICs and discrete devices have huge features in comparison yes, but the junctions still degrade notably under radiation. From my opinion as someone working on LEO satellite hardware, it's easy to have opinions about stuff like correctness and reliability because it is not naturally intuitive and usually requires observation of many samples over a long time that it doesn't affect most engineers. However, I've definitely seen a strong correlation between the effort spent on correctness and reliability, and the success of missions.