theoretically, a single defect will impact overall device yield by fraction of area for GPU / total device area * defect density so, if all the GPUS are 30%

theoretically, a single defect will impact overall device yield by fraction of area for GPU / total device area * defect density so, if all the GPUS are 30% of the device area, with a 5% defect density, binning from 10 to 9 is going to increase total yield by 1.6% square that for binning from 10 to 8 so 3% yield improvement there (so ~4.6% total) if the TMSC 3nm process is up at 10-20% then this starts to get material