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That's an interesting idea. I think you might be able to do reflective optics around a single crystal silicon core in near contact to the wafer backside. You'd
by kurthr 3y ago
That's an interesting idea. I think you might be able to do reflective optics around a single crystal silicon core in near contact to the wafer backside. You'd get another factor of 2.5x, which along with confocal imaging would be 50-65nm and that's almost good enough to image modern cells.
- ajb 3y agoCool! I guess this method would put some constraints on PCB design, since the need to scan the die physically would mean that you'd need a margin around it where nothing protruded higher vertically.