Yeah I didn't find it there either, but there is an IEEE paper with testing [0]. Looks like they only did single event effect testing (SEE) and not total ionizi

Yeah I didn't find it there either, but there is an IEEE paper with testing [0]. Looks like they only did single event effect testing (SEE) and not total ionizing dose (TID) as well. The SEE is for looking and effects for individual memory upsets, latchup, gate rupture, etc. You can still do a lot with a chip if you are only getting the non-destrucrive effects with memory scrubbing and resets (as long as you're not mission critical). But the destructive effects (like gate rupture) are the ones that could make this totally infeasible depending on the limit. Not surprised that they didn't do TID as it was only supposed to be a 90 day demo mission so not terribly long. And TID can be a costly test because it can take so long. As to the GPUs, yeah the main application is some processing when you are comm bandwidth constrained. Then you can send down processed products or snapshots from something that is collecting a lot of data (like large imager or high bandwidth SDR) [0] https://ieeexplore.ieee.org/document/8906649 https://ieeexplore.ieee.org/document/8906649