> "To be pedantic, I think you mean good source of entropy, rather than random data. The raw ADC data is likely to have statistic (Gaussian) bias ..." It might

> "To be pedantic, I think you mean good source of entropy, rather than random data. The raw ADC data is likely to have statistic (Gaussian) bias ..." It might have. There are also various ways of affecting the spectrum of the noise generated by the transistor using electromagnetic and thermal influence. But can you can positively discern that output as absolutely biased or affected, and crucially would you be able to take actual advantage of it? I'm not really certain, but for this type of solution I'd still err on the side of it not being a feasible attack.