3 ms·
I would hope, at the very least, everyone doing important work is using ECC and actively monitoring their correction counters. This should be automated. We do
by nsteel 3y ago
I would hope, at the very least, everyone doing important work is using ECC and actively monitoring their correction counters. This should be automated.
We do a lot of extra testing on top of our vendor's to catch weak bitcells before a device is shipped to customers. Over many generations of tech, RAM faults have always been a small but constant source of faults.
- teaearlgraycold 3y agoRAM isn’t the only source of these errors. They can originate inside of a CPU core as well.
- nsteel 3y agoYes. And in long wiring paths (in fact, these are far more frequent than core logic faults). However, we've found atpg stuck-at and transition fault coverage to be vastly better with each generation. Due to improvements in the methodologies, the tools themselves, and our vendor's attitude. Of course, even with coverage in the high 90s that still leaves many paths unchecked but it's a small percentage of the faults (that we find...). But for our devices, RAM faults don't seem to be getting much better, they're always a pain point.