https://semiengineering.com/knowledge_centers/test/scan-test-2/ https://semiengineering.com/knowledge_centers/test/scan-test... scan test: it involves scanning

https://semiengineering.com/knowledge_centers/test/scan-test-2/ https://semiengineering.com/knowledge_centers/test/scan-test... scan test: it involves scanning test patterns into internal circuits within the device under test (DUT). The design’s flip-flops are modified to allow them to function as stimulus and observation points, or “scan cells” during test, while performing their intended functional role during normal operation.