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Ellipsometry
- peter_d_sherman 4y ago>"Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model. It can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties." PDS: In other words, it's sort of like a microscope/debugger/scanner/probe (perhaps like Star Trek's "Tricorder") -- but for anything thin-film related -- such as printed electronics, LCD screens, solar panels, silicon IC's, thin-film transducers, thin-film nanotechnology, etc., etc. Related: Introduction to Ellipsometry and Polarized Light: https://www.youtube.com/watch?v=BycPkRIutqg https://www.youtube.com/watch?v=BycPkRIutqg What is Ellipsometry? https://www.jawoollam.com/resources/ellipsometry-tutorial/what-is-ellipsometry https://www.jawoollam.com/resources/ellipsometry-tutorial/wh... Spectroscopic Ellipsometry for Organic Electronics Applications: https://www.youtube.com/watch?v=PO2pwAZBsMw https://www.youtube.com/watch?v=PO2pwAZBsMw