> With physical access to a chip the only barrier to accessing that information is analysis time > That said, this tech doesn't look to be sufficient on its ow

> With physical access to a chip the only barrier to accessing that information is analysis time > That said, this tech doesn't look to be sufficient on its own. You probably need to analyze the contents of a chip, not just its structure. Those two statements appear to be contradictory. Could you clarify what you mean by them and in particular what you mean by the "contents" of a chip ? I know that low voltage SEM used to be capable of seeing voltage differences in chips but I have no idea if that's still feasible with the scale of today's technology (resolution tends to be worse at lower beam voltages) and the physical basis for flash memory.