3 ms·
JTAG is typically used for pass/fail binning and scanning of logic/memory at package (and occasionally wafer) test. Without something like that it's very hard t
by kurthr 5y ago
JTAG is typically used for pass/fail binning and scanning of logic/memory at package (and occasionally wafer) test. Without something like that it's very hard to get to <1000ppm defect rates. Properly designed, you wouldn't expect the Unique ID to be readable/extractable even from an enabled port, but could certainly reverse engineering its operation more easily.
- Animats 5y agoFor a small, low-speed single-purpose device like this, a self-test function can determine if the whole unit is a reject. There's no assembly into a larger system, where you want to detect bad parts before you build up a board. For a pure security device, the less internal access, the better.