Once power and heat in a chip go high enough, Electromigration causes reliability issues. It was already thought that this would become a problem to worry abou

Once power and heat in a chip go high enough, Electromigration causes reliability issues. It was already thought that this would become a problem to worry about at smaller process nodes, but does AVX-512 on Alder Lake push voltage and heat enough that it is an issue already? >Electromigration is the movement of atoms based on the flow of current through a material. If the current density is high enough, the heat dissipated within the material will repeatedly break atoms from the structure and move them. This will create both ‘vacancies’ and ‘deposits’. The vacancies can grow and eventually break circuit connections resulting in open-circuits, while the deposits can grow and eventually close circuit connections resulting in short-circuit. https://www.synopsys.com/glossary/what-is-electromigration.html https://www.synopsys.com/glossary/what-is-electromigration.h... >Aging Problems At 5nm And Below https://semiengineering.com/aging-problems-at-5nm-and-below/ https://semiengineering.com/aging-problems-at-5nm-and-below/