That rate sounds too high. Typically scan test gives 99.9% logic coverage. This me as random defects must hit this exact subset of logic to cause a fault undete

That rate sounds too high. Typically scan test gives 99.9% logic coverage. This me as random defects must hit this exact subset of logic to cause a fault undetectable by production test. Given defect rates are low, 1 in 1000 having a fault that got past theses tests seems too high. Unless of course Intel does not use scan test, and has a more functional type test method, though even then I'd imagine they must have a high coverage rate.