I wonder how well the SMART stats would predict that failure -- or whether they were sudden unexplained failures. If you run smartctl -A on your SDD device the

I wonder how well the SMART stats would predict that failure -- or whether they were sudden unexplained failures. If you run smartctl -A on your SDD device then for e.g. Intel you can see attribute 0xE9 or 233 -- media wear indicator, starting at 100% (mine's at 98% after 14 months, so this should hopefully indicate 2% of the wear out from writes). You can also see how many of the reserved blocks it's used (when it fails to reflash a cell when rewriting).