Yes, I was joking. :-) I think they do sometimes put test features in the corners if there's space. The electrical properties of the die can vary in interestin

Yes, I was joking. :-) I think they do sometimes put test features in the corners if there's space. The electrical properties of the die can vary in interesting ways [1], but the edges are usually worse than the center. [1] https://www.google.com/search?tbm=isch&q=wafer+defect+pattern https://www.google.com/search?tbm=isch&q=wafer+defect+patter...