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I had to endurance test some industrial flash EEPROM in a humidity/thermal cycling chamber to simulate failure, but the darn Atmel flash was too good. Even so,
by paypalcust83 6y ago
I had to endurance test some industrial flash EEPROM in a humidity/thermal cycling chamber to simulate failure, but the darn Atmel flash was too good. Even so, I wrote logging code that anticipated bit and block pathologies with a layer of turbo coding FEC to extend the serviceable life of the flash well beyond the manufacturer's spec.
- JshWright 6y agoIs that a good thing? One of the more important skills in engineering is meeting the design requirement as efficiently as possible.
- paypalcust83 6y agoWhat are you concerned about and what are you preaching about in vague, motivational quotes? Have you even ever done any embedded software development in a shipping industrial product? The only industrial flash available at the time (SLC) and already spec'ed in the manufacturing BOM had a warranted cycle time of 10^5 writes. It was doing upwards of 10^6 just fine, but it would've taken months to get close to 10^7. The desired goal was to make the flash live 10-20+ years while writing log data to spare space including data points such as temperature, voltage, errors, etc. for as long as possible.