DRAM testing is not really something you can do incrementally. Localized, bit-level failures are only one kind of failure; things get really interesting when yo

DRAM testing is not really something you can do incrementally. Localized, bit-level failures are only one kind of failure; things get really interesting when you have disturbances (e.g., a shorted address line or something causes writes to some location to also change bits in another location). Also, ECC failures usually cause a machine check. Not sure if you can control this on modern machines, it might be all or nothing.