A standard Scanning Electron Microscope can do down to 0.1 nm, so this isn't really letting us see anything we couldn't before. SEMs are regularly used to rever

A standard Scanning Electron Microscope can do down to 0.1 nm, so this isn't really letting us see anything we couldn't before. SEMs are regularly used to reverse engineer chips. The main difference is that the one in the article is non-destructive, whereas with a SEM you have to strip the sample (and do imaging) layer by layer.