3 ms·
Yes. There's been a lot of theoretical and practical work around the last couple decades about putting as little as possible in your single point of technical
by VLM 9y ago
Yes. There's been a lot of theoretical and practical work around the last couple decades about putting as little as possible in your single point of technical and legal/patent failure.
Small tools that do as little as possible, but do it very well, composed into bigger systems.
Philosophically identical to RISC vs CISC.