Impossible to characterize without high volume silicon or accurate yield models. We can say that historically, most failures are in SRAM cells and they are limi

Impossible to characterize without high volume silicon or accurate yield models. We can say that historically, most failures are in SRAM cells and they are limited to a few bits (core still works!) and that in general only one out of N cores will fail. For arguments sake, let's assume the while network always works, but 1 CPU may be broken. (this is what needs to be confirmed later). Does that help?