I'd venture there isn't. The problem of verifying the integrity of embedded silicon (at the microcircuitry level) is one that hasn't really been solved yet. T

I'd venture there isn't. The problem of verifying the integrity of embedded silicon (at the microcircuitry level) is one that hasn't really been solved yet. This has been a problem for the DoD since forever. THEY solved it partially by using US-sourced parts and working with industry to make sure the designs weren't sabotaged or otherwise backdoored. It's still an active concern though. http://www.dtic.mil/ndia/2014system/16990WedTrack1Shanahan.pdf http://www.dtic.mil/ndia/2014system/16990WedTrack1Shanahan.p...