3 ms·
Electromigration is more of a metal-layer interconnect problem. With wacky new transistor structures, we are more likely to see transistor problems, like hot-e
by mozumder 11y ago
Electromigration is more of a metal-layer interconnect problem. With wacky new transistor structures, we are more likely to see transistor problems, like hot-electron effects and other device-level problems.